undergraduate thesis
Nanotechnology measurements

Antun Kvaternik (2014)
Josip Juraj Strossmayer University of Osijek
Faculty of Electrical Engineering, Computer Science and Information Technology Osijek
Department of Electromechanical Engineering
Chair of Fundamentals of Electrical Engineering and Measurements
Metadata
TitleMjerenja u nanotehnologiji
AuthorAntun Kvaternik
Mentor(s)Dražen Dorić (thesis advisor)
Abstract
U ovom radu su opisane značajke i razmatranja vezana uz mjerenja u nanotehnologiji. Prikazan je kratki pregled standarda i općenito opisana nanometrologija kao područje mjeriteljstva koje se bavi mjerenjima nanometarske veličine. Navedeni su neki od instrumenata i metoda kojima se mogu vršiti nanometarska mjerenja. Na kraju su opisani i izvori mjernih pogrešaka
Keywordsnanometrology nanotechnology measurement scanning tunneling microscope atomic force microscope scanning electron microscope measurement errors.
Parallel title (English)Nanotechnology measurements
GranterJosip Juraj Strossmayer University of Osijek
Faculty of Electrical Engineering, Computer Science and Information Technology Osijek
Lower level organizational unitsDepartment of Electromechanical Engineering
Chair of Fundamentals of Electrical Engineering and Measurements
PlaceOsijek
StateCroatia
Scientific field, discipline, subdisciplineTECHNICAL SCIENCES
Electrical Engineering
Electromechanical Engineering
Study programme typeprofessional
Study levelundergraduate
Study programmeProfessional study programme of Electrical Engineering; branch Power Engineering
Study specializationbranch Power Engineering
Academic title abbreviationbacc.ing.el.
Genreundergraduate thesis
Language Croatian
Defense date2014-10-13
Parallel abstract (English)
This paper gives a description of features and considerations related to measurements in nanotechnology. A short description of standards is given as well as description of nanometrology as a field of metrology concerned with measurement at nanoscale levels. It also lists some of the instruments and methods used in nanoscale measurements. Source of measurement errors are described in the last chapter
Parallel keywords (Croatian)nanometrologija nanotehnologija mjerenje skenirajući tunelski mikroskop mikroskop atomskih sila skenirajući elektronski mikroskop mjerne pogreške
Resource typetext
Access conditionOpen access
Terms of usehttp://rightsstatements.org/vocab/InC/1.0/
URN:NBNhttps://urn.nsk.hr/urn:nbn:hr:200:615192
CommitterAnka Ovničević